Project database

The page provides a list of national and international projects where FER participates or has participated as a project coordinator or partner.


Projects

   

Project

Acronym:
- 
Name:
Simulation software for characterization of carrier transport in integrated semi-metallic thin films 
Project status:
From: 2009-09-01 To: 2010-09-01 (Completed)
Type (Programme):
BILAT 
Project funding:
-

International partner

Organisation Name:
Delft University of Technology 
Organisation adress:
Feldmannweg 17, 2628 CT Delft 
Organisation country:
Nizozemska 
Contact person name:
- 
Contact person email:
 

Croatian partner

Organisation name:
Fakultet elektrotehnike i računarstva 
Organisation address:
ZEMRIS, Unska 3, 10000 Zagreb  
Contact person name:
Tomislav Suligoj
Contact person tel:
+385 1 6129898 
Contact person fax:
+385 1 6129653 
Contact person e-mail:
Email 

Short description of project

Deposition of semiconductor dopants on silicon surface can be used as a source of diffusion and very shallow junctions can be obtained. Since such layer acts as a contact of the diffused layer, the carrier transport has to be studied throroughly. Specific properties of both minorty and majorty carriers in such layers has been observed and further analyses has to be performed. 

Short description of the task performed by Croatian partner

Study of transport properties of electrons and holes in semi-metallic thin films. Simulation of diffusion from deposited layer into silicon wiwthin a range of process conditions (temperature, time, concentration). Simulation of device performance with respect of the achieved diffused doping profiles.