dr. sc. Tihomir Knežević

External associate, Department of Electronics, Microelectronics, Computer and Intelligent Systems

Location:
Public phone number:
6129-564
Internal phone number:
564

On the Many Applications of Nanometer-Thin Pure Boron Layers in IC and Microelectromechanical Systems Technology

Nanver, L. K. ; Knezevic, Tihomir ; Liu, X. ; Thammaiah, S. D. ; Krakers, M. ;
2021.
Journal of nanoscience and nanotechnology

Modeling of Electrical Properties of Al-on-Ge-on-Si Schottky Barrier Diode

Lovro Marković ; Tihomir Knežević ; Tomislav Suligoj
2020.
Proceedings of the 43st International Convention MIPRO 2020

Diode design for studying material defect distributions with avalanche–mode light emission

Krakers, M. ; Knežević, T. ; Batenburg, K.M. ; Liu, X. ; Nanver, L.K.
2020.
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)

Broadband PureGaB Ge-on-Si photodiodes responsive in the ultraviolet to near-infrared range

Knežević, Tihomir ; Krakers, Max ; Nanver, Lis K.
2020.
Optical Components and Materials XVII

Investigation of light-emission and avalanche- current mechanisms in PureB SPAD devices

Nanver, Lis K. ; Krakers, Max ; Knezevic, Tihomir ; Karavidas, A. ; Agarwal, Vishal ; Hueting, Ray ; Dutta, Satadal ; Boturchuk, Ievgen ; Annema, Anne-Johan
2019.
Fifth Conference on Sensors, MEMS, and Electro- Optic Systems

Back-end-of-Line CMOS-Compatible Diode Fabrication with Pure Boron Deposition Down to 50°C

Knežević, Tihomir ; Elsayed, Ahmed ; Dick, Jan F. ; Liu, Xingyu ; Schulze, Joerg ; Suligoj, Tomislav ; Nanver, Lis K.
2019.
49th European Solid-State Device Research Conference

Reverse breakdown and light-emission patterns studied in Si PureB SPADs

Krakers, Max ; Knezevic, T. ; Nanver, L. K.
2019.
42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019

Minimization of dark counts in PureB SPADs for NUV/VUV/EUV light detection by employing a 2D TCAD-based simulation environment

Knezevic, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav
2019.
Physics and Simulation of Optoelectronic Devices XXVII

Limits on Thinning of Boron Layers With/Without Metal Contacting in PureB Si (Photo)Diodes

Knežević, Tihomir ; Liu, Xingyu ; Hardeveld, Erwin ; Suligoj, Tomislav ; Nanver, Lis K.
2019.
IEEE Electron Device Letters

Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers

Knezevic, Tihomir ; Suligoj, Tomislav ; Nanver, Lis K.
2019.
International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)

Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon

Nanver, L. K. ; Liu, X. ; Knezevic, Tihomir
2018.
2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)

2D dark-count-rate modeling of PureB single-photon avalanche diodes in a TCAD environment

Knezevic, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav
2018.
Physics and Simulation of Optoelectronic Devices XXVI

Non-linear behavior of Al-contacted pure amorphous boron (PureB) devices at low temperatures

Knežević, Tihomir ; Nanver, Lis K. ; Capan, Ivana ; Suligoj, Tomislav
2018.
41st International Convention MIPRO 2017 - Microelectronics, Electronics and Electronic Technology (MEET)

Indirect optical crosstalk reduction by highly- doped backside layer in single-photon avalanche diode arrays

Osrečki, Željko ; Knežević, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav
2018.
Optical and Quantum Electronics

Physical characteristics and applications of nanometer thin boron-on-silicon layers in silicon detector devices

Knežević Tihomir
2017.

TCAD-based Simulation Study of the 2D Dark Count Rate in InGaAs/InP Single Photon Avalanche Diodes Employing Standoff Breakdown Suppression Design

Tihomir Knežević ; Lis K. Nanver ; Tomislav Suligoj
2017.
EMN Mauritius Meeting 2017

Indirect optical crosstalk reduction by highly- doped backside layer in PureB single-photon avalanche diode arrays

Osrečki, Željko ; Knežević, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav ;
2017.
2017 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)

Perimeter effects from interfaces in ultra-thin layers deposited on nanometer-deep p+n silicon junctions

Knežević, Tihomir ; Lis K. Nanver ; Suligoj, Tomislav
2017.
40th International Convention MIPRO 2017 - Microelectronics, Electronics and Electronic Technology (MEET)

Silicon Drift Detectors with the Drift Field Induced by PureB-Coated Trenches

Knežević, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav
2016.
Photonics

Examination of the InP/InGaAs single-photon avalanche diodes by establishing a new TCAD-based simulation environment

Knežević, Tihomir ; Suligoj, Tomislav
2016.
2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

Analysis of Electrical and Optical Characteristics of InP/InGaAs Avalanche Photodiodes in Linear Regime by a New Simulation Environment

Knežević, Tihomir ; Suligoj, Tomislav
2016.
39th International Convention MIPRO 2015 - Microelectronics, Electronics and Electronic Technology (MEET)

Design of Passive-Quenching Active-Reset Circuit with Adjustable Hold-Off Time for Single-Photon Avalanche Diodes

Berdalović, Ivan ; Osrečki, Željko ; Šegmanović, Filip ; Grubišić, Dragan ; Knežević, Tihomir ; Suligoj, Tomislav
2016.
39th International Convention MIPRO 2015 - Microelectronics, Electronics and Electronic Technology (MEET)

Solving practical numerical problems in microelectronic devices and semiconductor technology

Poljak, Mirko ; Knežević, Tihomir ; Suligoj, Tomislav
2015.

Optimization of floating guard ring parameters in separate-absorption-and-multiplication silicon avalanche photodiode structure

Janeković, Ivan ; Knežević, Tihomir ; Suligoj, Tomislav ; Grubišić, Dragan
2015.
38th International Convention MIPRO 2015 - Microelectronics, Electronics and Electronic Technology (MEET)

Design of a scalable model of GaN devices

Suligoj, Tomislav ; Koričić, Marko ; Poljak, Mirko ; Žonja, Sanja ; Knežević, Tihomir ; Žilak, Josip
2014.

PureB layers – XRD measurements and temperature characteristics

Suligoj, Tomislav ; Knežević Tihomir ; Poljak, Mirko ; Žonja, Sanja ; Žilak, Josip
2014.

Avalanche Photodiode Simulations

Suligoj, Tomislav ; Knežević, Tihomir
2014.

Large Area Reverse Structure Avalanche Photodiode Simulations

Suligoj, Tomislav ; Koričić, Marko ; Knežević, Tihomir ; Poljak, Mirko ; Žilak, Josip
2014.

XPS Data interpretation of PureB layers

Suligoj, Tomislav ; Koričić, Marko ; Knežević, Tihomir ; Poljak, Mirko ; Žilak, Josip
2013.

Spectroscopic elipsometry and Internal photoemission characterization of of PureB layers

Suligoj, Tomislav ; Knežević, Tihomir ; Poljak, Mirko ; Žilak, Josip
2013.

Optimization of diode capacitance of Annular BS detector

Suligoj, Tomislav ; Knežević, Tihomir ; Poljak, Mirko ; Žonja, Sanja ; Žilak, Josip
2012.

Modelling of Electrical Characteristics of Ultrashallow Pure Amorphous Boron p+n Junctions

Knežević, Tihomir ; Suligoj, Tomislav ; Šakić, Agata ; Nanver, Lis K.
2012.
35th International Convention MIPRO 2011

Emitter Coupled Logic (ECL) Circuit Testing and Measurements in a Novel Horizontal Current Bipolar Transistor (HCBT) Technology – 2nd Lot

Suligoj, Tomislav ; Koričić, Marko ; Knežević, Tihomir ; Žilak, Josip
2011.

Boron-layer silicon photodiodes for high-efficiency low-energy electron detection

Šakić, Agata ; Nanver, Lis K. ; Scholtes Tom L.M. ; Heerkensa, Carel Th.H. ; Knežević, Tihomir ; Van Veen, Gerard ; Kooijman, Kees ; Vogelsang, Patrick
2011.
Solid-state electronics

Optimization of the perimeter doping of ultrashallow p+-n--n- photodiodes

Knežević, Tihomir ; Suligoj, Tomislav ; Šakić, Agata ; Nanver, Lis K.
2011.
34th International Convention MIPRO 2011

Series Resistance Optimization of High-Sensitivity Si-based VUV Photodiodes

Shi, L. ; Nanver, Lis K. ; Šakić, Agata ; Nihtianov, Stoyan N. ; Knežević, Tihomir ; Gottwald, Alexander ; Kroth, Udo
2011.
IEEE International Instrumentation and Measurement Technology Conference

Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection

Šakić, Agata ; Nanver, Lis K. ; Van Veen, Gerard ; Kooijman, Kees ; Vogelsang, Patrick ; Scholtes, T. L. M. ; De Boer, W. B. ; Wien, W. ; Milosavljević, Silvana ; Heerkens, C. T. H. ; Knežević, Tihomir ; Spee, I.
2010.
IEEE International Electron Devices Meeting

Optimization of Stress Distribution in Sub-45 nm CMOS Structures

Žilak, Josip ; Knežević, Tihomir ; Suligoj, Tomislav
2009.
45th International Conference on Microelectronics, Devices and Materials MIDEM 2009

Characteristics of ultra-thin body FinFET structures under the influence of stress

Knežević, Tihomir
2009.

Stress Effect in Ultra-Narrow FinFET Structures

Knežević, Tihomir ; Žilak, Josip ; Suligoj, Tomislav
2009.
32nd International Convention MIPRO 2009

Teaching duties

University graduate