M-center in low-energy electron irradiated 4H-SiC

Modeling and Simulation Study of Electrical Properties of Ge-on-Si Diodes with Nanometer-thin PureGaB Layer

On the Many Applications of Nanometer-Thin Pure Boron Layers in IC and Microelectromechanical Systems Technology

PureB diode fabrication using physical or chemical vapor deposition methods for increased back-end-of-line accessibility

Nanometer-thin pure boron CVD layers as material barrier to Au or Cu metallization of Si

Broadband PureGaB Ge-on-Si photodiodes responsive in the ultraviolet to near-infrared range

Diode design for studying material defect distributions with avalanche–mode light emission

Modeling of Electrical Properties of Al-on-Ge-on-Si Schottky Barrier Diode

Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers

Limits on thinning of boron layers with/without metal contacting in PureB Si (photo)diodes

Minimization of dark counts in PureB SPADs for NUV/VUV/EUV light detection by employing a 2D TCAD-based simulation environment

Reverse breakdown and light-emission patterns studied in Si PureB SPADs

Back-end-of-Line CMOS-Compatible Diode Fabrication with Pure Boron Deposition Down to 50°C

Investigation of light-emission and avalanche- current mechanisms in PureB SPAD devices

Indirect optical crosstalk reduction by highly- doped backside layer in single-photon avalanche diode arrays

Non-linear behavior of Al-contacted pure amorphous boron (PureB) devices at low temperatures

2D dark-count-rate modeling of PureB single-photon avalanche diodes in a TCAD environment

Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon

Perimeter effects from interfaces in ultra-thin layers deposited on nanometer-deep p+n silicon junctions

Indirect optical crosstalk reduction by highly- doped backside layer in PureB single-photon avalanche diode arrays

TCAD-based Simulation Study of the 2D Dark Count Rate in InGaAs/InP Single Photon Avalanche Diodes Employing Standoff Breakdown Suppression Design

Physical characteristics and applications of nanometer thin boron-on-silicon layers in silicon detector devices

Design of Passive-Quenching Active-Reset Circuit with Adjustable Hold-Off Time for Single-Photon Avalanche Diodes

Analysis of Electrical and Optical Characteristics of InP/InGaAs Avalanche Photodiodes in Linear Regime by a New Simulation Environment

Examination of the InP/InGaAs single-photon avalanche diodes by establishing a new TCAD-based simulation environment

Silicon Drift Detectors with the Drift Field Induced by PureB-Coated Trenches

Optimization of floating guard ring parameters in separate-absorption-and-multiplication silicon avalanche photodiode structure

Rješavanje praktičnih problema iz mikroelektroničkih komponenti i poluvodičke tehnologije

Avalanche Photodiode Simulations

Large Area Reverse Structure Avalanche Photodiode Simulations

PureB layers – XRD measurements and temperature characteristics

Design of a scalable model of GaN devices

Spectroscopic elipsometry and Internal photoemission characterization of of PureB layers

XPS Data interpretation of PureB layers

Modelling of Electrical Characteristics of Ultrashallow Pure Amorphous Boron p⁺n Junctions

Optimization of diode capacitance of Annular BS detector

Series Resistance Optimization of High-Sensitivity Si-based VUV Photodiodes

Optimization of the perimeter doping of ultrashallow p⁺-n^--n^- photodiodes

Boron-layer silicon photodiodes for high-efficiency low-energy electron detection

Emitter Coupled Logic (ECL) Circuit Testing and Measurements in a Novel Horizontal Current Bipolar Transistor (HCBT) Technology – 2nd Lot

Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection

Stress Effect in Ultra-Narrow FinFET Structures

Karakteristike FinFET struktura s ultra tankim tijelom pod utjecajem naprezanja

Optimization of Stress Distribution in Sub-45 nm CMOS Structures