Na FER-u postoji više zaposlenika s imenom

    dr. sc. Tihomir Knežević

    Vanjski suradnik, Zavod za elektroniku, mikroelektroniku, računalne i inteligentne sustave

    Back-end-of-Line CMOS-Compatible Diode Fabrication with Pure Boron Deposition Down to 50°C

    Knežević, Tihomir ; Elsayed, Ahmed ; Dick, Jan F. ; Liu, Xingyu ; Schulze, Joerg ; Suligoj, Tomislav ; Nanver, Lis K.
    Znanstveni radovi u zbornicima skupova, 2019.
    49th European Solid-State Device Research Conference

    Reverse breakdown and light-emission patterns studied in Si PureB SPADs

    Krakers, Max ; Knezevic, T. ; Nanver, L. K.
    Znanstveni radovi u zbornicima skupova, 2019.
    42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019

    Minimization of dark counts in PureB SPADs for NUV/VUV/EUV light detection by employing a 2D TCAD-based simulation environment

    Knezevic, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav
    Znanstveni radovi u zbornicima skupova, 2019.
    Physics and Simulation of Optoelectronic Devices XXVII

    Limits on Thinning of Boron Layers With/Without Metal Contacting in PureB Si (Photo)Diodes

    Knezevic, Tihomir ; Liu, Xingyu ; Hardeveld, Erwin ; Suligoj, Tomislav ; Nanver, Lis K.
    Znanstveni i pregledni radovi, 2019.

    Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers

    Knezevic, Tihomir ; Suligoj, Tomislav ; Nanver, Lis K.
    Znanstveni radovi u zbornicima skupova, 2019.
    International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)

    Limits on Thinning of Boron Layers With/Without Metal Contacting in PureB Si (Photo)Diodes

    Knezevic, Tihomir ; Liu, Xingyu ; Hardeveld, Erwin ; Suligoj, Tomislav ; Nanver, Lis K.
    Znanstveni i pregledni radovi, 2019.

    2D dark-count-rate modeling of PureB single-photon avalanche diodes in a TCAD environment

    Knezevic, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav
    Znanstveni radovi u zbornicima skupova, 2018.
    Physics and Simulation of Optoelectronic Devices XXVI

    Non-linear behavior of Al-contacted pure amorphous boron (PureB) devices at low temperatures

    Knezevic, Tihomir ; Nanver, Lis K. ; Capan, Ivana ; Suligoj, Tomislav
    Znanstveni radovi u zbornicima skupova, 2018.
    41st International Convention MIPRO 2017 - Microelectronics, Electronics and Electronic Technology (MEET)

    Indirect optical crosstalk reduction by highly- doped backside layer in single-photon avalanche diode arrays

    Osrečki, Željko ; Knežević, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav
    Znanstveni i pregledni radovi, 2018.

    TCAD-based Simulation Study of the 2D Dark Count Rate in InGaAs/InP Single Photon Avalanche Diodes Employing Standoff Breakdown Suppression Design

    Tihomir Knežević ; Lis K. Nanver ; Tomislav Suligoj
    Sažeci u zbornicima i časopisima, 2017.
    EMN Mauritius Meeting 2017

    Indirect optical crosstalk reduction by highly- doped backside layer in PureB single-photon avalanche diode arrays

    Osrečki, Željko ; Knežević, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav ;
    Znanstveni radovi u zbornicima skupova, 2017.
    2017 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)

    Perimeter effects from interfaces in ultra-thin layers deposited on nanometer-deep p+n silicon junctions

    Knežević, Tihomir ; Lis K. Nanver ; Suligoj, Tomislav
    Znanstveni radovi u zbornicima skupova, 2017.
    40th International Convention MIPRO 2017 - Microelectronics, Electronics and Electronic Technology (MEET)

    Silicon Drift Detectors with the Drift Field Induced by PureB-Coated Trenches

    Knežević, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav
    Znanstveni i pregledni radovi, 2016.

    Examination of the InP/InGaAs single-photon avalanche diodes by establishing a new TCAD-based simulation environment

    Knežević, Tihomir ; Suligoj, Tomislav
    Znanstveni radovi u zbornicima skupova, 2016.
    2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

    Analysis of Electrical and Optical Characteristics of InP/InGaAs Avalanche Photodiodes in Linear Regime by a New Simulation Environment

    Knežević, Tihomir ; Suligoj, Tomislav
    Znanstveni radovi u zbornicima skupova, 2016.
    39th International Convention MIPRO 2015 - Microelectronics, Electronics and Electronic Technology (MEET)

    Design of Passive-Quenching Active-Reset Circuit with Adjustable Hold-Off Time for Single-Photon Avalanche Diodes

    Berdalović, Ivan ; Osrečki, Željko ; Šegmanović, Filip ; Grubišić, Dragan ; Knežević, Tihomir ; Suligoj, Tomislav
    Znanstveni radovi u zbornicima skupova, 2016.
    39th International Convention MIPRO 2015 - Microelectronics, Electronics and Electronic Technology (MEET)

    Sveučilišni priručnik: Rješavanje praktičnih problema iz mikroelektroničkih komponenti i poluvodičke tehnologije

    Poljak, Mirko ; Knežević, Tihomir ; Suligoj, Tomislav
    Ostalo, 2015.

    Optimization of floating guard ring parameters in separate-absorption-and-multiplication silicon avalanche photodiode structure

    Janeković, Ivan ; Knežević, Tihomir ; Suligoj, Tomislav ; Grubišić, Dragan
    Znanstveni radovi u zbornicima skupova, 2015.
    38th International Convention MIPRO 2015 - Microelectronics, Electronics and Electronic Technology (MEET)

    Design of a scalable model of GaN devices

    Suligoj, Tomislav ; Koričić, Marko ; Poljak, Mirko ; Žonja, Sanja ; Knežević, Tihomir ; Žilak, Josip
    , 2014.

    PureB layers – XRD measurements and temperature characteristics

    Suligoj, Tomislav ; Knežević Tihomir ; Poljak, Mirko ; Žonja, Sanja ; Žilak, Josip
    , 2014.

    Avalanche Photodiode Simulations

    Suligoj, Tomislav ; Knežević, Tihomir
    , 2014.

    Large Area Reverse Structure Avalanche Photodiode Simulations

    Suligoj, Tomislav ; Koričić, Marko ; Knežević, Tihomir ; Poljak, Mirko ; Žilak, Josip
    , 2014.

    XPS Data interpretation of PureB layers

    Suligoj, Tomislav ; Koričić, Marko ; Knežević, Tihomir ; Poljak, Mirko ; Žilak, Josip
    , 2013.

    Spectroscopic elipsometry and Internal photoemission characterization of of PureB layers

    Suligoj, Tomislav ; Knežević, Tihomir ; Poljak, Mirko ; Žilak, Josip
    , 2013.

    Optimization of diode capacitance of Annular BS detector

    Suligoj, Tomislav ; Knežević, Tihomir ; Poljak, Mirko ; Žonja, Sanja ; Žilak, Josip
    , 2012.

    Modelling of Electrical Characteristics of Ultrashallow Pure Amorphous Boron p+n Junctions

    Knežević, Tihomir ; Suligoj, Tomislav ; Šakić, Agata ; Nanver, Lis K.
    Znanstveni radovi u zbornicima skupova, 2012.
    35th International Convention MIPRO 2011

    Emitter Coupled Logic (ECL) Circuit Testing and Measurements in a Novel Horizontal Current Bipolar Transistor (HCBT) Technology – 2nd Lot

    Suligoj, Tomislav ; Koričić, Marko ; Knežević, Tihomir ; Žilak, Josip
    , 2011.

    Boron-layer silicon photodiodes for high-efficiency low-energy electron detection

    Šakić, Agata ; Nanver, Lis K. ; Scholtes Tom L.M. ; Heerkensa, Carel Th.H. ; Knežević, Tihomir ; Van Veen, Gerard ; Kooijman, Kees ; Vogelsang, Patrick
    Znanstveni i pregledni radovi, 2011.

    Optimization of the perimeter doping of ultrashallow p+-n--n- photodiodes

    Knežević, Tihomir ; Suligoj, Tomislav ; Šakić, Agata ; Nanver, Lis K.
    Znanstveni radovi u zbornicima skupova, 2011.
    34th International Convention MIPRO 2011

    Series Resistance Optimization of High-Sensitivity Si-based VUV Photodiodes

    Shi, L. ; Nanver, Lis K. ; Šakić, Agata ; Nihtianov, Stoyan N. ; Knežević, Tihomir ; Gottwald, Alexander ; Kroth, Udo
    Znanstveni radovi u zbornicima skupova, 2011.
    IEEE International Instrumentation and Measurement Technology Conference

    Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection

    Šakić, Agata ; Nanver, Lis K. ; Van Veen, Gerard ; Kooijman, Kees ; Vogelsang, Patrick ; Scholtes, T. L. M. ; De Boer, W. B. ; Wien, W. ; Milosavljević, Silvana ; Heerkens, C. T. H. ; Knežević, Tihomir ; Spee, I.
    Znanstveni radovi u zbornicima skupova, 2010.
    IEEE International Electron Devices Meeting

    Optimization of Stress Distribution in Sub-45 nm CMOS Structures

    Žilak, Josip ; Knežević, Tihomir ; Suligoj, Tomislav
    Znanstveni radovi u zbornicima skupova, 2009.
    45th International Conference on Microelectronics, Devices and Materials MIDEM 2009

    Karakteristike FinFET struktura s ultra tankim tijelom pod utjecajem naprezanja

    Knežević, Tihomir
    Diplomski radovi (uključujući i diplomske radove starog programa), 2009.

    Stress Effect in Ultra-Narrow FinFET Structures

    Knežević, Tihomir ; Žilak, Josip ; Suligoj, Tomislav
    Znanstveni radovi u zbornicima skupova, 2009.
    32nd International Convention MIPRO 2009

    Nastava

    Sveučilišni preddiplomski

    Sveučilišni diplomski