Comparison of Discrete Bipolar Transistors and MOSFETs for High-Speed Switching Application

Versatile BiCMOS Technology Platform for the Low-cost Integration of Multi-purpose Applications

Horizontal Current Bipolar Transistor (HCBT) Technology for High Linearity RF Mixers

Measurement of RF Linear Operating Area of Bipolar Transistors

Doherty Power Amplifier in Horizontal Current Bipolar Transistor (HCBT) Technology

On the Potential of Lateral BJTs and SiGe HBTs in Advanced CMOS Technologies

Impact of Large-signal Operation on DC Operating Point of Horizontal Current Bipolar Transistor

Balanced RF Power Amplifier Design in Horizontal Current Bipolar Transistor (HCBT) Technology

Analysis of Horizontal Current Bipolar Transistor (HCBT) Characteristics for RF Power Amplifiers

Large-signal characterization of horizontal current bipolar transistor (HCBT) by load-pull measurements

Analysis of Tunable BVCEO in Horizontal Current Bipolar Transistor with Floating Field Plates

Noise Figure Characterization of Horizontal Current Bipolar Transistor (HCBT)

Analysis of Hot Carrier-Induced Degradation of Horizontal Current Bipolar Transistor (HCBT)

A High-Voltage Single-Emitter Reduced-Surface-Field Horizontal Current Bipolar Transistor for BiCMOS Integration

Impact of the Local p-well Substrate Parameters on the Electrical Performance of the Double- Emitter Reduced-Surface-Field Horizontal Current Bipolar Transistor

Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology

Improving the Horizontal Current Bipolar Transistor Breakdown Voltage by Floating Field Plates

Innovative Bipolar-CMOS Integration for RF Communication Circuits with Low-Cost High-Performance Horizontal Current Bipolar Transistor (HCBT)

Impact of the Emitter Polysilicon Thickness on the Performance of High-Linearity Mixers with Horizontal Current Bipolar Transistors

Fully-integrated Voltage Controlled Oscillator in Low-cost HCBT Technology

Reliability Degradation Mechanisms of Horizontal Current Bipolar Transistor

A Low-Cost 180nm BiCMOS Technology with Horizontal Current Bipolar Transistor (HCBT) for Wireless Communication ICs

Investigation of Double-Emitter Reduced-Surface-Field Horizontal Current Bipolar Transistor Breakdown Mechanisms

Double-Emitter Reduced-Surface-Field Horizontal Current Bipolar Transistor With 36 V Breakdown Integrated in BiCMOS at Zero Cost

Impact of the emitter length scaling on electrical characteristics of horizontal current bipolar transistor with single polysilicon region

Impact of Emitter Interface Treatment on the Horizontal Current Bipolar Transistor (HCBT) Characteristics and RF Circuit Performance

Horizontal current bipolar transistor (HCBT) - a low-cost, high-performance flexible BiCMOS technology for RF communication applications

Examination of Horizontal Current Bipolar Transistor (HCBT) Reliability Characteristics

HCBT MIX1B-Aktivno dvostruko balansirano frekvencijsko miješalo s pojačalom lokalnog oscilatora u tehnologiji bipolarnog tranzistora s horizontalnim tokom struje

HCBT MIX1B-Aktivno dvostruko balansirano frekvencijsko miješalo u tehnologiji bipolarnog tranzistora s horizontalnim tokom struje

Large Area Reverse Structure Avalanche Photodiode Simulations

PureB layers – XRD measurements and temperature characteristics

Design of a scalable model of GaN devices

Optimization of Horizontal Current Bipolar Transistor (HCBT) Technology Parameters for Linearity in RF Mixer

Spectroscopic elipsometry and Internal photoemission characterization of of PureB layers

XPS Data interpretation of PureB layers

Impact of Bipolar Transistor Parameters on the Characteristics of the Double-Balanced Mixer

Optimization of diode capacitance of Annular BS detector

Emitter Coupled Logic (ECL) Circuit Testing and Measurements in a Novel Horizontal Current Bipolar Transistor (HCBT) Technology – 2nd Lot

Utjecaj naprezanja na karakteristike skaliranih CMOS tranzistora

Stress Effect in Ultra-Narrow FinFET Structures

Optimization of Stress Distribution in Sub-45 nm CMOS Structures