
Structural analysis of amorphous Si films prepared by magnetron sputtering
Paramagnetic defects in elemental semiconductors and their alloys
STRUCTURAL ANALYSIS OF AMORPHOUS Si FILMS PREPARED BY MAGNETRON SPUTTERING
Structural characterization of thin amorphous Si films
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University undergraduate
- Physics (Lecturers)
- Physics 1 (Lecturers)
- Physics 2 (Lecturers)
- Physics 2R (Lecturers)