Pristupačnost
Temperature-Dependent Noise Performance of Single-Photon Avalanche Diodes and Active Quenching Circuits in 180-nm HV CMOS
Ultra-Low Dark Count Rate SPAD Fully Integrated in a 180 nm High-Voltage CMOS Process
Ultra-Low Dark Count Rate SPAD Fully Integrated in a 180 nm High-Voltage CMOS Process
Temperature-Dependent Noise Performance of Single-Photon Avalanche Diodes and Active Quenching Circuits in 180-nm HV CMOS
Layout-Dependent Noise Performance of Single- Photon Avalanche Diodes in 180 nm High-Voltage CMOS Technology
Teaching
University undergraduate
- Electronics 1 (Lecturer in charge, Laboratory exercises)
- Electronics 1 (Lecturer in charge, Laboratory exercises)
- Electronics 2 (Lecturer in charge, Laboratory exercises)
- Electronics 2 (Laboratory exercises)
University graduate
- Fundamentals of microelectronics (Lecturer in charge, Laboratory exercises)
Personal data
Graduation year:
2021.